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In this work, AlGaN/GaN HEMTs with dual-layer SiNx stressors (composed of a low-stress layer and a high-stress layer) were investigated. The low-stress padding layer solved the surface damage problem caused during the deposition of the…

Compared with silicon (Si) power devices, Silicon carbide (SiC) devices have the advantages of fast switching speed and low on-resistance. However, the effects of non-ideal characteristics of SiC MOSFETs and stray parameters (especially…

Systems and Control · Electrical Eng. & Systems 2023-11-14 Jialin Zheng , Zhengming Zhao , Han Xu , Weicheng Liu , Yangbin Zeng

A broad TCAD simulation analysis of a monolithic common drain bidirectional GaN HEMT was performed. We used gate-to-gate distances of 4 microns and 6 microns for the devices optimized with two field plates. The breakdown voltages were 675V…

Applied Physics · Physics 2024-10-25 Md Tahmidul Alam , Chirag Gupta

Low power consumption in both static and dynamic modes of operation is a key requirement in modern, highly scaled nanoelectronics. Tunneling field-effect transistors (TFETs) that exploit direct band-to-band tunneling of charges and exhibit…

Since the 1960's when Gordon Moore proposed that the transistor density in our electronic devices should double every two years while the cost is halved, the semiconductor industry has taken this statement to heart. Over the last few…

Materials Science · Physics 2022-07-27 Aditya Muralidharan

Multi-bridge channel field effect transistor (MBCFET) provides several advantages over FinFET technology and is an attractive solution for sub-5 nm technology nodes. MBCFET is a natural choice for devices that use semiconducting layered…

Mesoscale and Nanoscale Physics · Physics 2022-09-14 Hitesh S , Pushkar Dasika , Kenji Watanabe , Takashi Taniguchi , Kausik Majumdar

We introduce a silicon metal-oxide-semiconductor quantum dot architecture based on a single polysilicon gate stack. The elementary structure consists of two enhancement gates separated spatially by a gap, one gate forming a reservoir and…

Mesoscale and Nanoscale Physics · Physics 2019-03-07 S. Rochette , M. Rudolph , A. -M. Roy , M. Curry , G. Ten Eyck , R. Manginell , J. Wendt , T. Pluym , S. M. Carr , D. Ward , M. P. Lilly , M. S. Carroll , M. Pioro-Ladrière

Dynamic control of conductivity and optical properties via atomic structure changes is of tremendous technological importance in information storage. Energy consumption considerations provide a driving force toward employing thin materials…

Materials Science · Physics 2016-02-16 Yao Li , Karel-Alexander N. Duerloo , Kerry Wauson , Evan J. Reed

AlN has the largest bandgap in the wurtzite III-nitride semiconductor family, making it an ideal barrier for a thin GaN channel to achieve strong carrier confinement in field-effect transistors, analogous to silicon-on-insulator technology.…

Silicon carbide (SiC) metal-oxide-semiconductor field-effect-transistors (MOSFETs) enable high-voltage and high-temperature power conversion. Compared to Si devices, they suffer from pronounced gate leakage due to the reduced electron…

Materials Science · Physics 2025-12-03 Ang Feng , Alexander Karl , Dominic Waldhör , Marina Avramenko , Peter Moens , Tibor Grasser

Studying the electrical and structural properties of the interface of the gate oxide (SiO2) with silicon carbide (4H-SiC) is a fundamental topic, with important implications for understanding and optimizing the performances of…

Scalability in the fabrication and operation of quantum computers is key to move beyond the NISQ era. So far, superconducting transmon qubits based on aluminum Josephson tunnel junctions have demonstrated the most advanced results, though…

Applied Physics · Physics 2022-09-08 Tom Doekle Vethaak

Nanofabricated metal gate electrodes are commonly used to confine and control electrons in electrostatically defined quantum dots. However, these same gates impart strain-induced potential fluctuations that can potentially impair device…

Mesoscale and Nanoscale Physics · Physics 2025-10-03 Collin C. D. Frink , Talise Oh , E. S. Joseph , Merritt P. Losert , E. R. MacQuarrie , Benjamin D. Woods , M. A. Eriksson , Mark Friesen

The tremendous progress in Metal Oxide Semiconductor (MOS) technology has been a direct consequence of device scaling for past several decades. But as we have entered the nanometer era many problems related to leakage currents and other…

Applied Physics · Physics 2019-11-12 Raja N Mir

Fully-processed SiC power metal-oxide-semiconductor field-effect transistors (MOSFETs) emit light during switching of the gate terminal, while both drain and source terminals are grounded. The emitted photons are caused by defect-assisted…

Structural transformation between metallic (1T) and semiconducting (2H) phases of single-layered MoS2 was systematically investigated by an in situ STEM with atomic precision. The 1T/2H phase transition is comprised of S and/or Mo…

Materials Science · Physics 2013-10-10 Yung-Chang Lin , Dumitru O. Dumcenco , Ying-Sheng Huang , Kazu Suenaga

The p-n junction diode and field-effect transistor (FET) are the two most ubiquitous building blocks of modern electronics and optoelectronics. In recent years, the emergence of reduced dimensionality materials has suggested that these…

In this article, we proposed a Variable threshold MOSFET(VTMOS)approach which is realized from Dynamic Threshold MOSFET(DTMOS), suitable for sub-threshold digital circuit operation. Basically the principle of sub- threshold logics is…

Other Computer Science · Computer Science 2010-07-15 K. Ragini , M. Satyam , B. C. Jinaga

The nature of a metal--insulator transition tuned by external gates in quantum Hall (QH) systems with point constrictions at integer bulk filling, as reported in recent experiments of Roddaro et al. [1], is addressed. We are particularly…

Mesoscale and Nanoscale Physics · Physics 2007-05-23 Emiliano Papa , Tilo Stroh

A method for assessing the quality of electronic material properties of thin-film metal oxide semiconductor field-effect transistors (MOSFETs) is presented. By investigating samples with MOCVD-grown MoS${_2}$ channels exposed to atmospheric…

Applied Physics · Physics 2025-04-03 Eros Reato , Ardeshir Esteki , Benny Ku , Zhenxing Wang , Michael Heuken , Max C. Lemme , Olof Engström