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We report the implementation of energy dispersive X-ray spectroscopy for layered semiconductors in the form of atomically thin transition metal dichalcogenides. The technique is based on a scanning electron microscope equipped with a…

Mesoscale and Nanoscale Physics · Physics 2022-11-17 Anna Rupp , Jonas Göser , Zhijie Li , Philipp Altpeter , Ismail Bilgin , Alexander Högele

This paper reports a comprehensive study of Si-based GeSn mid-infrared photodetectors, which includes: 1) the demonstration of a set of photoconductors with Sn compositions ranging from 10.5% to 22.3%, showing the cut-off wavelength has…

In this work we consider the inverse problem of reconstructing the optical properties of a layered medium from an elastography measurement where optical coherence tomography is used as the imaging method. We hereby model the sample as a…

Numerical Analysis · Mathematics 2024-02-23 Peter Elbau , Leonidas Mindrinos , Leopold Veselka

We developed a technique that enables to replace a metallic waveguide cladding with a low-index (n $\sim$ 1.4) material - CaF2 or BaF2 - that in addition is transparent from the mid-IR up to the visible range: elevated confinement is…

We present a few recent developments in the field of electron backscatter diffraction (EBSD). We highlight how open source algorithms and open data formats can be used to rapidly to develop microstructural insight of materials. We include…

Computational Physics · Physics 2019-08-15 Alex Foden , Alessandro Previero , Thomas Benjamin Britton

We study coherent backscattering of a quasi-monochromatic laser by a dilute gas of cold two-level atoms. We consider the perturbative regime of weak intensities, where nonlinear effects arise from {\em inelastic} two-photon scattering…

Mesoscale and Nanoscale Physics · Physics 2007-05-23 T. Wellens , B. Gremaud , D. Delande , C. Miniatura

Microscopes and various forms of interferometers have been used for decades in optical metrology of objects that are typically larger than the wavelength of light {\lambda}. However, metrology of subwavelength objects was deemed impossible…

We demonstrate a motion-free intensity diffraction tomography technique that enables direct inversion of 3D phase and absorption from intensity-only measurements for weakly scattering samples. We derive a novel linear forward model,…

Image and Video Processing · Electrical Eng. & Systems 2018-06-26 Ruilong Ling , Waleed Tahir , Hsing-Ying Lin , Hakho Lee , Lei Tian

Deep learning-based semiconductor defect inspection has gained traction in recent years, offering a powerful and versatile approach that provides high accuracy, adaptability, and efficiency in detecting and classifying nano-scale defects.…

Computer Vision and Pattern Recognition · Computer Science 2024-07-18 Amit Prasad , Bappaditya Dey , Victor Blanco , Sandip Halder

The scattering of light observed through the turbid underwater channel is often regarded as the leading challenge when designing underwater electro-optical imaging systems. There have been many approaches to address the effects of…

Optics · Physics 2018-04-17 Chensheng Wu , Robert Lee , Christopher C. Davis

Infrared (IR) imaging is one of the significant tools for the quality control measurements of fabricated samples. Standard IR imaging techniques use direct measurements, where light sources and detectors operate at IR range. Due to the…

Quantum Physics · Physics 2020-09-01 Anna V. Paterova , Hongzhi Yang , Zi S. D. Toa , Leonid A. Krivitsky

Reflection phase imaging provides label-free, high-resolution characterization of biological samples, typically using interferometric-based techniques. Here, we investigate reflection phase microscopy from intensity-only measurements under…

Quantitative Methods · Quantitative Biology 2019-12-18 Alex Matlock , Anne Sentenac , Patrick C. Chaumet , Ji Yi , Lei Tian

The theory of elastic light scattering by semiconductor quantum dots is suggested. The semiclassical method, applying retarded potentials to avoid the problem of bounder conditions for electric and magnetic field, is used. The exact results…

Mesoscale and Nanoscale Physics · Physics 2007-05-23 I. G. Lang , L. I. Korovin , S. T. Pavlov

A simple method was developed to observe the interference patterns of the light reflected by the interfaces of thin liquid films. Employing a fluorescent microscope with epi-illumination, we collected the 2D patterns of interference fringes…

Optics · Physics 2010-06-14 V. Berejnov , D. Li

We present an imaging technique that allows the recovery of the transparency profile of wavelength-scale objects with deep subwavelength resolution based on far-field intensity measurements. The approach, interscale mixing microscopy (IMM),…

Optics · Physics 2017-03-21 Sandeep Inampudi , Nicholas Kuhta , Viktor A. Podolskiy

Czochralski-grown silicon crystals were studied by the techniques of the low-angle mid-IR-light scattering and electron-beam-induced current. The large-scale accumulations of electrically-active impurities detected in this material were…

Materials Science · Physics 2011-06-08 V. P. Kalinushkin , A. N. Buzynin , V. A. Yuryev , O. V. Astafiev

We investigated the possibility of augmenting the fluence of electrons traversing CdTe thin film and thus increasing the detected signal pursuing two venues: adding a high-Z metal layer to the back of the detector surface, and adding a top…

Medical Physics · Physics 2023-01-11 Fatemeh Akbari , Diana Shvydka

In this paper I summarize the science motivations, as well as a few mid-infrared spectroscopic methods used to identify the principal mechanisms of energy production in dust enshrouded galactic nuclei. The development of the various…

Astrophysics · Physics 2007-05-23 Vassilis Charmandaris , the Spitzer/IRS Instrument Team

This work continues the development of the raytracing method of [1] for computing the scattered fields from metasurfaces characterized by locally periodic reflection and transmission coefficients. In this work, instead of describing the…

Optics · Physics 2022-02-16 Scott Stewart , Yvo L. C. de Jong , Tom J. Smy , Shulabh Gupta

The increase in the number of counterfeit and recycled microelectronic chips in recent years has created significant security and safety concerns in various applications. Hence, detecting such counterfeit chips in electronic systems is…

Cryptography and Security · Computer Science 2023-02-23 Maryam Saadat Safa , Tahoura Mosavirik , Shahin Tajik