Related papers: Elastic Mid-Infrared Light Scattering: a Basis for…
We investigate a method for controlling light scattering based on the excitation of non-radiating states in a half-space through a tailored choice of incident radiation. For a fixed particle geometry, we demonstrate that small variations in…
The MIRI Si:As IBC detector arrays extend the heritage technology from the Spitzer IRAC arrays to a 1024 x 1024 pixel format. We provide a short discussion of the principles of operation, design, and performance of the individual MIRI…
Hetero-epitaxial crystalline films underlie many electronic and optical technologies but are prone to forming defects at their hetero-interfaces. Atomic-scale defects such as threading dislocations that propagate into a film impede the flow…
In materials science and particularly electron microscopy, Electron Back-scatter Diffraction (EBSD) is a common and powerful mapping technique for collecting local crystallographic data at the sub-micron scale. The quality of the…
In absence of a lens to form an image, incoherent or partially coherent light scattering off an obstructive or reflective object forms a broad intensity distribution in the far field with only feeble spatial features. We show here that…
Evanescent wave amplification is observed, for the first time to our knowledge, inside a half-wavelength-thick wire medium slab used for subwavelength imaging. The wire medium is analyzed using both a spatially dispersive finite-difference…
We present a simple measurement and analysis technique to determine the fraction of optical loss due to both radiation (scattering) and linear absorption in microphotonic components. The method is generally applicable to optical materials…
Two inverse scattering schemes were recently developed in \cite{LiLiuShangSun} for locating multiple electromagnetic (EM) scatterers, respectively, of small size and regular size compared to the detecting EM wavelength. Both schemes make…
Reflective ptychography is a promising lensless imaging technique with a wide field of view, offering significant potential for applications in semiconductor manufacturing and detection. However, many semiconductor materials are coated with…
Optical methods for monitoring the electrochemical reaction at the interface are advantageous because of their table-top setup and ease of integration into reactors. Here we apply EDL-modulation microscopy to one of the main components of…
The mid-infrared region is crucial for elucidating the unique biochemical signatures of microorganisms. The MIR resonant structures turned out to facilitate exceptional performance owing to the enhance electric field confinement in the…
Interferometric scattering microscopy has been a very promising technology for highly sensitive label-free imaging of a broad spectrum of biological nanoparticles from proteins to viruses in a high-throughput manner. Although it can reveal…
We summarize the R&D activities on a novel semitransparent microstrip sensor to be used on laser-based alignment systems for silicon trackers. The new sensor is used both for particle tracking and laser detection. The aim of this research…
Multifunctional thin films in energy-related devices often must be electrically insulating where a single nanoscale defect can result in complete device-scale failure. Locating and characterizing such defects presents a fundamental problem…
Electron backscatter diffraction is a widely used technique for nano- to micro-scale analysis of crystal structure and orientation. Backscatter patterns produced by an alloy solid solution matrix and its ordered superlattice exhibit only…
Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalable to large numbers of images or real-time analysis. In this…
IR microspectroscopy of single biological cells is challenged by strong light scattering, which produces baseline effects and peak distortions in the IR spectra and hinders the direct extraction of chemical information. Current methods for…
Controlling crystalline material defects is crucial, as they affect properties of the material that may be detrimental or beneficial for the final performance of a device. Defect analysis on the sub-nanometer scale is enabled by…
We describe a self calibrating optical technique that allows to perform absolute measurements of scattering cross sections for the light scattered at extremely small angles. Very good performances are obtained by using a very simple optical…
Microstructure characterisation has been greatly enhanced through the use of electron backscatter diffraction (EBSD), where rich maps are generated through analysis of the crystal phase and orientation in the scanning electron microscope…