Related papers: Visualizing Three-Dimensional Micromechanical Resp…
Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…
Quantitative measurements of extended defects in crystalline materials are important in understanding material behaviour. X-ray line profile analysis provides a complement to direct counting in the electron microscope, but is an indirect…
Deformation gradient tensor fields are reconstructed in three dimensions (mapping all 9 tensor components) using synthetic Dark-Field X-ray Microscopy data. Owing to the unique properties of the microscope, our results imply that the…
Nanomechanical spectroscopy (NMS) is a recently developed approach to determine optical absorption spectra of nanoscale materials via mechanical measurements. It is based on measuring changes in the resonance frequency of a membrane…
Diffusion Map is a spectral dimensionality reduction technique which is able to uncover nonlinear submanifolds in high-dimensional data. And, it is increasingly applied across a wide range of scientific disciplines, such as biology,…
X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly…
The three-dimensional (3D) microstructures of polycrystalline materials exert a critical influence on their mechanical and physical properties. Realistic, controllable construction of these microstructures is a key step toward elucidating…
This article is a tutorial on the practical implementation of a method of measurement of minute deformations based on multiple scattering. This technic has been recently developed and has proven to give new insights on the spatial…
Our understanding of the elasticity and rheology of disordered materials, such as granular piles, foams, emulsions or dense suspensions relies on improving experimental tools to characterize their behaviour at the particle scale. While 2D…
The paper presents a micromechanical representation of deformation in 2D granular materials. The representation is a generalization of K. Bagi's work and is based upon the void-cell approach of M. Satake. The general representation applies…
Microscopic fringe projection profilometry is a powerful 3D measurement technique with a theoretical measurement accuracy better than one micron provided that the measured targets can be imaged with good fringe visibility. However,…
Understanding the interactions between microstructure, strain, phase, and material behavior is crucial in many scientific fields. However, quantifying these correlations is challenging, as it requires the use of multiple instruments and…
Generalized ellipsometry, a non-destructive optical characterization technique, is employed to determine geometrical structure parameters and anisotropic dielectric properties of highly spatially coherent three-dimensionally nanostructured…
It is shown here that fracture after a brief plastic strain, typically of a few percents, is a necessary consequence of the polycrystalline nature of the materials. The polycrystal undergoing plastic deformation is modeled as a flowing…
We describe a method that uses total internal reflection at the water-air interface inside a large, transparent tank, to measure the interface's deflections. Using this configuration, we obtain an optical set-up where the liquid surface…
The image fractal analysis is actively used in all science branches. In particular in materials science the fractal analysis is applied to study microstructure of deformed metals because its structure can be interpreted as the fractal…
To leverage advancements in machine learning for metallic materials design and property prediction, it is crucial to develop a data-reduced representation of metal microstructures that surpasses the limitations of current physics-based…
The present study focuses on the optical properties of functionalized surfaces and how the surface geometry impacts them. Physical measurements of reflected light are required to understand the visual aspect of such surfaces. Bidirectional…
Schlieren deflectometry aims at characterizing the deflections undergone by refracted incident light rays at any surface point of a transparent object. For smooth surfaces, each surface location is actually associated with a sparse…
High angular resolution electron backscatter diffraction (HR-EBSD) affords an increase in angular resolution, as compared to 'conventional' Hough transform based EBSD, of two orders of magnitude, enabling measurements of relative…