Related papers: Phase imaging with intermodulation atomic force mi…
Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a…
IR spectroscopy has been widely used for chemical identification and quantitative analysis of reactions occurring in a specific time and space domains by measuring an average signal of the entire system1. Achieving IR measurements with…
In this work, we report the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of sub-nanometer resolution imaging and machining of nanoscale structures, while the…
Nonlinear systems can be probed by driving them with two or more pure tones while measuring the intermodulation products of the drive tones in the response. We describe a digital lock-in analyzer which is designed explicitly for this…
Atom probe tomography (APT) helps elucidate the link between the nanoscale chemical variations and physical properties, but it has limited structural resolution. Field ion microscopy (FIM), a predecessor technique to APT, is capable of…
The so-called indentation stiffness tomography technique for detecting the interior mechanical properties of an elastic sample with an inhomogeneity is analyzed in the framework of the asymptotic modeling approach under the assumption of…
Outlined here is a technique for sub-wavelength infrared surface imaging performed using a phase matched optical parametric oscillator laser and an atomic force microscope as the detection mechanism. The technique uses a novel surface…
We present a computer-based active interferometer stabilization method that can be set to an arbitrary phase difference and does not rely on modulation of the interfering beams. The scheme utilizes two orthogonal modes propagating through…
Sub-nm resolution images can be achieved by Atomic Force Microscopy (AFM) on samples that are deposited on hard substrates. However, it is still extremely challenging to image soft interfaces, such as biological membranes, due to the…
This paper describes continuously phase-modulated standing surface acoustic waves (CPM-SSAW) and its application for particle separation in multiple pressure nodes. A linear change of phase in CPM-SSAW applies a force to particles whose…
The phase-integral method (PIM) is an asymptotic method of the geometrical optics or semi-classical type for solving approximately, but in many cases very accurately, a wide class of differential equations in physics. Unlike the related…
Active particles may undergo phase separation when interactions oppose self-propulsion, in the absence of any cohesive forces. The corresponding Motility-Induced Phase Separation (MIPS) is arguably the simplest non-trivial collective…
Real-space mapping of doping concentration in semiconductor devices is of great importance for the microelectronic industry. In this work, a scanning microwave impedance microscope (MIM) is employed to resolve the local conductivity…
The aim of this article is to provide a complete analysis of the behavior of a noncontact atomic force microscope (NC-AFM). We start with a review of the equations of motion of a tip interacting with a surface in which the stability…
Mid-infrared photo-induced force microscopy (IR-PiFM/PiF-IR) enables high-resolution chemical imaging of surfaces with lateral resolution less than 5 nm. Here are some answers to questions about the physical background, practical handling…
In atomic force microscopy (AFM), the exchange and alignment of the AFM cantilever with respect to the optical beam and position-sensitive detector (PSD) are often performed manually. This process is tedious and time-consuming and sometimes…
Atomic Force Microscopy (AFM) conventional static force curves and Force Feedback Microscopy (FFM) force curves acquired with the same cantilever at the solid/air and solid/liquid interfaces are here compared. The capability of the FFM to…
Atoms or pairs of ions picked up by probe tips used in dynamic force microscopy (DFM) can be strongly displaced and even hop discontinuously upon approach to the sample surface. The energy barriers for some of those hops are of the right…
The distance dependence and atomic-scale contrast observed in nominal contact potential difference (CPD) signals recorded by KPFM on surfaces of insulating and semiconducting samples, have stimulated theoretical attempts to explain such…
Quantum metrology harnesses quantum entanglement to improve measurement precision beyond standard quantum limit. Although nonlinear interaction is essential for generating entanglement, during signal accumulation, it becomes detrimental and…