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Related papers: Coherent scattering from silicon mocrystal surface

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We study the onset and development of ledge instabilities during growth of vicinal metal surfaces using kinetic Monte Carlo simulations. We observe the formation of periodic patterns at [110] close packed step edges on surfaces vicinal to…

Condensed Matter · Physics 2009-11-07 M. Rusanen , I. T. Koponen , J. Heinonen , T. Ala-Nissila

We systematically investigate polarization-dependent Raman spectra of a monolayer crystal of WS2 on the (100) and (230) surfaces of diamond. At ambient pressure, identical polarization dependence of the Raman spectra is observed on the…

Materials Science · Physics 2025-04-28 Yi Zhao , Lingxiao Zhao , Chengjiang Du , Ruirui Liu , John A. McGuire , Yanpeng Qi

We have studied the electronic properties, in relation to their structural properties, of monolayers of 1-octadecene attached on a hydrogen-terminated (111) silicon surface. The molecules are attached using the free-radical reaction between…

Materials Science · Physics 2009-11-10 Corinne Miramond , Dominique Vuillaume

We study the behavior of single atoms on an infinite vicinal surface assuming certain degree of step permeability. Assuming complete lack of re-evaporation an ruling out nucleation the atoms will inevitably join kink sites at the steps but…

Other Condensed Matter · Physics 2018-02-14 Bogdan Ranguelov , Ivan Markov

We studied coherent backscattering (CBS) of light from opal photonic crystals in air at different incident inclination angles, wavelengths and along various [hkl] directions inside the opals. Similar to previously obtained CBS cones from…

Disordered Systems and Neural Networks · Physics 2009-10-31 J. Huang , N. Eradat , M. E. Raikh , Z. V. Vardeny , A. A. Zakhidov , R. H. Baughman

When an X-ray area detector based on a single crystalline material, for instance, a state of the art hybrid pixel detector, is illuminated from a point source by monochromatic radiation, a pattern of lines appears which overlays the…

Instrumentation and Detectors · Physics 2014-08-01 Christian Gollwitzer , Michael Krumrey

We demonstrate single spin spectroscopy of a fluorescent tumbling defect in silicon called the G center, behaving as a pseudo-molecule randomly reorienting itself in the crystalline matrix. Using high-resolution spin spectroscopy, we reveal…

The Sudden Approximation is applied to invert structural data on randomly corrugated surfaces from inert atom scattering intensities. Several expressions relating experimental observables to surface statistical features are derived. The…

Materials Science · Physics 2016-08-31 Daniel A. Lidar

The properties of artificially grown thin films are strongly affected by surface processes during growth. Coherent X-rays provide an approach to better understand such processes and fluctuations far from equilibrium. Here we report results…

We report ARPES and a set of in situ STM measurements on a narrow-terrace-width vicinal Cu(111) crystal surface, Cu(775), whose vicinal cut lies close to the transition between terrace and step modulation. These measurements show sharp…

Mesoscale and Nanoscale Physics · Physics 2014-05-23 Nader Zaki , Kevin Knox , Richard M. Osgood , Peter D. Johnson , Jun Fujii , Ivana Vobornik , Giancarlo Panaccione

Using field theoretic renormalization, an MBE-type growth process with an obliquely incident influx of atoms is examined. The projection of the beam on the substrate plane selects a "parallel" direction, with rotational invariance…

Statistical Mechanics · Physics 2007-05-23 B. Schmittmann , Gunnar Pruessner , Hans-Karl Janssen

Scanning tunneling luminescence microscopy (STLM) along with scanning tunneling spectroscopy (STS) is applied to a step-bunched, oxidized 4H-SiC surface prepared on the silicon face of a commercial, n-type SiC wafer using a silicon melt…

The monocrystalline silicon neutron beam window is one of the key components of neutron spectrometers and thin circular plate.Monocrystalline silicon is a brittle material and its strength is not constant but is consistent with the Weibull…

Instrumentation and Detectors · Physics 2014-11-25 Zhou Liang , Qu Hua-Min

The effects of a step defect and a random array of point defects (such as vacancies or substitutional impurities) on the force of friction acting on a xenon monolayer film as it slides on a silver (111) substrate are studied by molecular…

Materials Science · Physics 2009-10-31 M. S. Tomassone , J. B. Sokoloff

Soft X-ray resonant scattering studies at the Mn $L_{\texttt{II, III}}$- and the La $M_{\texttt{IV, V}}$- edges of single-crystal LaSr$_2$Mn$_2$O$_7$ are reported. At low temperatures, below $T_\texttt{N} \approx 160$ K, energy scans with a…

Strongly Correlated Electrons · Physics 2014-07-08 H. -F. Li , Y. Su , Tapan Chatterji , A. Nefedov , J. Persson , P. Meuffels , Y. Xiao , Th. Brückel

Strain has a crucial effect on the optical and electronic properties of nanostructures. We calculate the atomistic strain distribution in silicon nanocrystals up to a diameter of 3.2 nm embedded in an amorphous silicon dioxide matrix. A…

Mesoscale and Nanoscale Physics · Physics 2009-05-21 Dündar E. Yılmaz , Ceyhun Bulutay , Tahir Çağın

The random intensity distribution observed due to the propagation of a coherent beam of light through a scattering medium is known as a speckle pattern. The interaction of the speckles with a birefringent crystal, here, YVO4 results in the…

Optics · Physics 2021-08-11 Kapil K. Gangwar , Abhijit Roy , Maruthi M. Brundavanam

We report an experimental assessment of surface kinetic roughening properties that are anisotropic in space. Working for two specific instances of silicon surfaces irradiated by ion-beam sputtering under diverse conditions (with and without…

Materials Science · Physics 2015-06-11 Edoardo Vivo , Matteo Nicoli , Martin Engler , Thomas Michely , Luis Vázquez , Rodolfo Cuerno

Grazing incidence interferometry has been applied to rough planar and cylindrical surfaces. As suitable beam splitters diffractive optical phase elements are quite common because these allow for the same test sensitivity for all surface…

Atomic-resolution scanning transmission electron microscopy (STEM) characterization requires precise tilting of the specimen to high symmetric zone axis, which is usually processed in reciprocal space by following the diffraction patterns.…

Materials Science · Physics 2024-06-04 Jiake Wei , Zhangze Xu , Wenjie Shen , Bin Feng , Ryo Ishikawa , Naoya Shibata , Yuichi Ikuhara , Xuedong Bai
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