English
Related papers

Related papers: Reverse depth profiling of electrodeposited Co/Cu …

200 papers

We present a detailed study of the interface morphology of an electro-deposited (ED) Ni/Cu bilayer film by using off-specular (diffuse) neutron reflectivity technique and Atomic Force Microscopy (AFM). The Ni/Cu bilayer has been…

Materials Science · Physics 2015-05-13 Surendra Singh , Saibal Basu , S. K. Ghosh

It has been shown previously for electrodeposited Co/Cu multilayers that the single-bath electrodeposition process can be optimized from an electrochemical point of view in order to avoid unwanted Co dissolution and incorporation of Co in…

Materials Science · Physics 2016-09-05 B. G. Tóth , L. Péter , J. Dégi , Á. Révész , D. Oszetzky , G. Molnár , I. Bakonyi

In this communication, we report results of a high resolution sputter depth profiling analysis of a stack of 16 alternating MgO and ZnO nanolayers grown by atomic layer deposition (ALD) with thickness of ~5.5 nm per layer. We used an…

Materials Science · Physics 2014-03-21 S. V. Baryshev , J. A. Klug , A. V. Zinovev , C. E. Tripa , J. W. Elam , I. V. Veryovkin

Nanoscale metallic multilayer (NMM) films are systems offering insight into the role of interfaces in metal plasticity, deformation, and strengthening mechanisms. Magnetron sputtering was used to fabricate the Ta-Cu NMM films with a…

Materials Science · Physics 2025-08-27 Daniel Karpinski , Tomas Polcar , Andrey Bondarev

Co-sputtered Au-Ni thin films having thickness of 30 nm were deposited on Si(100) substrates and irradiated with 160 keV ^{40}Ar^{+} under ambient condition at a number of fluences and analyzed using Rutherford backscattering spectrometry…

Materials Science · Physics 2009-04-16 D. Datta , S. R. Bhattacharyya

The surface area of electrodeposited thin films of Ni, Co, and NiCo was evaluated using electrochemical double-layer capacitance, electrochemical area measurements using the [Ru(NH$_3$)$_6$]$^{3+}$/[Ru(NH$_3$)$_6$]$^{2+}$ redox couple, and…

Materials Science · Physics 2016-02-04 Matthew J. Gira , Kevin P. Tkacz , Jennifer R. Hampton

Sculptured copper thin films were deposited on glass substrates, using different deposition rates. The nano-structure and morphology of the films were obtained, using X-ray diffraction (XRD), atomic force microscopy (AFM) and scanning…

Optics · Physics 2010-11-09 H. Savaloni , F. Babaei , S. Song , F. Placido

Depth profiling of thin films by inert gas sputtering is one of the most important applications of Auger electron spectroscopy and X-ray photoelectron spectroscopy. Such an analysis monitors the elemental in-depth composition of the thin…

Materials Science · Physics 2021-01-05 Uwe Scheithauer

We investigated the possibility of augmenting the fluence of electrons traversing CdTe thin film and thus increasing the detected signal pursuing two venues: adding a high-Z metal layer to the back of the detector surface, and adding a top…

Medical Physics · Physics 2023-01-11 Fatemeh Akbari , Diana Shvydka

The giant magnetoresistance (GMR) effect has been widely investigated on electrodeposited ferromagnetic/non-magnetic (FM/NM) multilayers generally containing a large number of bilayers. In most applications of the GMR effect, layered…

Materials Science · Physics 2016-08-16 B. G. Tóth , L. Péter , I. Bakonyi

By knowing the phase and modules of the reflection coefficient in neutron reflectometry problems, a unique result for the scattering length density (SLD) of a thin film can be determined which will lead to the exact determination of type…

Materials Science · Physics 2011-08-30 Saeed S. Jahromi , Seyed Farhad Masoudi

Thin film systems are often analysed by using sputter depth profiling. First the sample gets eroded by inert gas ion impact during sputter depth profiling. Then the elemental composition of the freshly unveiled surface is determined by…

Instrumentation and Detectors · Physics 2017-11-28 Uwe Scheithauer

The giant magnetoresistance (GMR) was investigated for electrodeposited Co/Cu multilayers. In order to better understand the formation of individual layers and their influence on GMR, multilayers produced by two different deposition…

Materials Science · Physics 2017-04-19 N. Rajasekaran , L. Pogány , Á. Révész , B. G. Tóth , S. Mohan , L. Péter , I. Bakonyi

We report an interesting magnetic behavior of a Co film (thickness ~ 350 {\AA}) grown on Si/Ti/Cu buffer layer by electro-deposition (ED) technique. Using depth sensitive X-ray reflectivity and polarized neutron reflectivity (PNR) we…

Materials Science · Physics 2016-04-12 Surendra Singh , C. L. Prajapat , D. Bhattacharya , S. K. Ghosh , M. R. Gonal , S. Basu

Quantification of Ge in Si1-xGex structures (0.092<x<0.78) was carried by time-of-flight secondary ion mass spectrometry (TOF-SIMS) and electron-gas secondary neutral mass spectrometry (SNMS). A good linear correlation (R2>0.9997) of…

We investigate the growth conditions for thin (less than 200 nm) sputtered aluminum (Al) films. These coatings are needed for various applications, e.g. for advanced manufacturing processes in the aerospace industry or for nanostructures…

A combinatorial thin-film synthesis approach combined with a high throughput analysis methodology was successfully applied to synthesize TiN/Ni coatings with optimum mechanical properties. The synthesis approach consists of the deposition…

Fabrication of semiconductor heterostructures is now so precise that metrology has become a key challenge for progress in science and applications. It is now relatively straightforward to characterize classic III-V and group IV…

Nanometer thin single-walled carbon nanotube (CNT) films collected from the aerosol chemical deposition reactors have gathered attention for their promising applications. Densification of these pristine films provides an important way to…

Nanoindentation is an effective way of finding mechanical properties at nanoscale. They are especially useful for thin films where elimination of the substrate effect is required. The mechanism is based upon depth sensing indentation based…

Materials Science · Physics 2016-07-25 A. S. Bhattacharyya
‹ Prev 1 2 3 10 Next ›