Related papers: Micro force Measurement by an Optical Method
We introduce a micromachined force scale for laser power measurement by means of radiation pressure sensing. With this technique, the measured laser light is not absorbed and can be utilized while being measured. We employ silicon…
Atomic Force Microscope images of a crack intersecting the free surface of a glass specimen are taken at different stages of subcritical propagation. From the analysis of image pairs, it is shown that a novel Integrated Digital Image…
In this study we present a new method of measuring magnetostriction with an atomic force microscope adapted for the application magnetic fields. The experiment allows us to visualise, in an elegant and educational way how the lateral…
We study the detection of weak coherent forces by means of an optomechanical device formed by a highly reflecting isolated mirror shined by an intense and highly monochromatic laser field. Radiation pressure excites a vibrational mode of…
A new method for measuring the linewidth enhancement factor of a laser is proposed. It is based on frequency-modulated optical injection, combined with dual-frequency laser operation. The linewidth enhancement factor {\alpha} is deduced…
Optical forces acting on nano-sized particles are typically too small to be useful for particle manipulation. We theoretically and numerically demonstrate a mechanism that can significantly enhance the optical force acting on a small…
We present the first measurements of kilowatt laser power with an uncertainty less than 1 %. These represent progress toward the most accurate measurements of laser power above 1 kW at 1070 nm wavelength and establish a more precise link…
A common use for atomic force microscopy is to quantify local forces through tip-sample interactions between the probe tip and a sample surface. The accuracy of these measurements depends on the accuracy to which the cantilever spring…
This paper shows a novel method to precisely measure the laser power using an optomechanical system. By measuring a mirror displacement caused by the reflection of an amplitude modulated laser beam, the number of photons in the incident…
Photo-induced magnetic force between nanostructures, at optical frequencies, is investigated theoretically. Till now optical magnetic effects are not used in scanning probe microscopy because of the vanishing natural magnetism with…
We describe a method for feedback-regulation of a microcantilever's response using optical radiation pressure. One laser measures the position of the cantilever and another laser applies a force that is a phase-shifted function of that…
We measured the electromagnetic stress-induced local strain distribution on a centimeter-sized parallel-plate metallic resonant unit illuminated with microwave. Using a fiber interferometer, we found that the strain changes sign across the…
The fabrication of complex nano-scale structures, which is a crucial step in the scaling of (nano) electronic devices, often leads to residual stress in the different layers present. This stress gradient can change many of the material…
A force measurement technique has been developed that utilizes a clamped fiber optic element both as a cantilever and as a highly sensitive probe of the static and dynamic displacement of a sample that is mounted near its free end. Light…
The frequency of a 700mW monolithic non-planar Nd:YAG ring laser (NPRO) depends with a large coupling coefficient (some MHz/mW) on the power of its laser-diode pump source. Using this effect we demonstrate the frequency stabilization of an…
The optical force density acting in transparent dielectric media due to short laser excitation is theoretically analyzed. For typical laser pulses with picosecond duration, the momentum component of the optical force becomes of the same…
A new instrument is required to accommodate the need for increased portability and accuracy in laser power measurement above 100 W. Reflection and absorption of laser light provide a measurable force from photon momentum exchange that is…
The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a collo{\"i}dal probe and the surface. From this measure one can…
Light pressure effect has been discovered long ago and has been used as an optical method to manipulate microand nanoparticles. It is usually considered as a nonresonant effect determined by the transfer of the momentum of light. However,…
Electrostatic force microscopy at cryogenic temperatures is used to probe the electrostatic interaction of a conductive atomic force microscopy tip and electronic charges trapped in localized states in an insulating layer on a…