Related papers: Micro force Measurement by an Optical Method
We demonstrate the measurement of laterally induced optical forces using an Atomic Force Microscope (AFM). The lateral electric field distribution between a gold coated AFM probe and a nano-aperture in a gold film is mapped by measuring the…
Friction measurements in the range of several meters per second are still of great interests. With the atomic force microscopy (AFM), the oscilaltion situation of the quartz crystal resonators of 3MHz resonance frequency are studied. And…
The mechanical properties of crystalline materials can be substantially modified under confinement. Such modified macroscopic properties are usually governed by the altered microstructures and internal stress fields. Here, we use a parallel…
We report an improved precision measurement of the Casimir force. The force is measured between a large Al coated sphere and flat plate using an Atomic Force Microscope. The primary experimental improvements include the use of smoother…
Optical forces in guided-wave nanostructures have recently been proposed as an effective means of mechanically actuating and tuning optical components. In this work, we study the properties of a photonic crystal optomechanical cavity…
We demonstrate how the ineluctable presence of thermal noise alters the measurement of forces acting on microscopic and nanoscopic objects. We quantify this effect exemplarily for a Brownian particle near a wall subjected to gravitational…
In recent years there has been an explosive development of interest in the measurement of forces at the microscopic level, such as within living cells, as well as the properties of fluids and suspensions on this scale, using optically…
Atomic Force Microscopy (AFM) methods utilizing resonant mechanical vibrations of cantilevers in contact with a sample surface have shown sensitivities as high as few picometers for detecting surface displacements. Such a high sensitivity…
Nano- and micromagnetic materials have been extensively employed in micro-functional devices. However, measuring small-scale mechanical and magnetomechanical properties is challenging, which restricts the design of new products and the…
Forces on a nanoparticle in an optical trap are analysed. Brownian motion is found to be one of the major challenges to trap a nanoparticle. Accordingly, suitable spatial electric field distribution of laser beam is suggested to enhance the…
Interatomic-force measurements are regularly performed using frequency-modulation atomic force microscopy. This requires conversion of the observed shift in the resonant frequency of a force-sensing cantilever, to the actual force…
Miniaturized mechanical resonators have proven to be excellent force sensors. However, they usually rely on resonant sensing schemes, and their excellent performance cannot be utilized for the detection of static forces. Here, we report on…
We demonstrate the application of Atomic Force Microscopy (AFM) based optical force microscopy to map the optical near-fields with nanometer resolution, limited only by the AFM probe geometry. We map the electric field distributions of…
Nanomechanical oscillators have been employed as transducers to measure force, mass and charge with high sensitivity. They are also used in opto- or electromechanical experiments with the goal of quantum control and phenomena of mechanical…
Weak measurement amplification, which is considered as a very promising scheme in precision measurement, has been applied to various small physical quantities estimation. Since many quantities can be converted to phase signal, it is thus…
The electrical polarization of the laser crystal by external electrical field can change significantly the output laser parameters such as wavelength of excitation and generation, spectral bandwidth, excitation and emission cross-sections,…
In multifrequency atomic force microscopy higher eigenmodes are externally excited to enhance resolution and contrast while simultaneously increasing the number of experimental observables with the use of gentle forces. Here, the…
A novel method is presented for measuring impulsive forces generated by devices which are fed with medium power microwave signals. The forces are measured with a torsion balance or weighing scale, as usual, but the microwave signal is…
In this $\ll$ contribution we address the question to what extent surface charges affect contact-mode scanning force microscopy measurements. % We therefore designed samples where we could generate localized electric field distributions…
The pressure-induced changes in the optical properties of $\beta$-Na$_{0.33}$V$_2$O$_5$ single crystals at room temperature were studied by polarization-dependent Raman and far-infrared reflectivity measurements under high pressure. From…