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A simplified digital spectrometer for the study of $\gamma$-rays with energies up to $\sim100$ MeV is presented and tested. The spectrometer is only consisted of a fast digital oscilloscope and three scintillation detectors which can work…
To date X-ray spectroscopy has become a routine tool that can reveal highly local and element-specific information on the electronic structure of atoms in complex environments. Here, we focus on nuclear dynamical effects in X-ray spectra…
Autonomous synthesis and characterization of inorganic materials requires the automatic and accurate analysis of X-ray diffraction spectra. For this task, we designed a probabilistic deep learning algorithm to identify complex multi-phase…
Cargo imaging with Megavoltage (MV) radiography has important applications for detecting illicit materials. It enables decomposing and quantifying materials with different atomic numbers by imaging cargo at two different x-ray energies, or…
Electron energy-loss spectroscopy (EELS) is a powerful tool for imaging chemical variations at the nanoscale. Here, we investigate a polymer/organic small molecule-blend used as absorber layer in an organic solar cell and employ EELS for…
Raman spectroscopy is frequently used to identify composition, structure and layer thickness of 2D materials. Here, we describe an efficient first-principles workflow for calculating resonant first-order Raman spectra of solids within…
X-ray microspectroscopic techniques are essential for studying morphological and chemical changes in materials, providing high-resolution structural and spectroscopic information. However, its practical data analysis for reliably retrieving…
Multi-spectral computed tomography is an emerging technology for the non-destructive identification of object materials and the study of their physical properties. Applications of this technology can be found in various scientific and…
Spectroscopic techniques are essential for studying material properties, but the small cross-sections of some methods may result in low signal-to-noise ratios (SNRs) in the collected spectra. In this article we present methods, based on…
X-ray energy spectrum plays an essential role in computed tomography (CT) imaging and related tasks. Due to the high photon flux of clinical CT scanners, most of spectrum estimation methods are indirect and usually suffered from various…
Light passing through scattering media will be strongly scattered and diffused into complex speckle pattern, which contains almost all the spatial information and spectral information of the objects. Although various methods have been…
Spectrograph is an optical device that is used to disperse photons of different energies $E$ into distinct directions and space locations, and to take a snapshot of the whole spectrum of photon energies with a spatially sensitive photon…
Light-matter interaction is exploited in spectroscopic techniques to access information about molecular, atomic or nuclear constituents of the sample of interest. While scattered light carries both amplitude and phase information of the…
We introduce a nanomechanical platform for fast and sensitive measurements of the spectrally-resolved optical dielectric function of 2D materials. At the heart of our approach is a suspended 2D material integrated into a nanomechanical…
X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly…
This work investigates two physics-based models that simulate the non-linear partial differential algebraic equations describing an electric double layer supercapacitor. In one model the linear dependence between electrolyte concentration…
Dual-energy computed tomography (DECT) is a promising technology that has shown a number of clinical advantages over conventional X-ray CT, such as improved material identification, artifact suppression, etc. For proton therapy treatment…
Atomic-resolution imaging with scanning transmission electron microscopy is a powerful tool for characterizing the nanoscale structure of materials, in particular features such as defects, local strains, and symmetry-breaking distortions.…
Dual energy computerized tomography has gained great interest because of its ability to characterize the chemical composition of a material rather than simply providing relative attenuation images as in conventional tomography. The purpose…
Energetic disorder has been known for decades to limit the performance of structurally disordered semiconductors such as amorphous silicon and organic semiconductors. However, in the past years, high performance organic solar cells have…