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Evaluation of residual elastic strain within the bulk of engineering components or natural objects is a challenging task, since in general it requires mapping a six-component tensor quantity in three dimensions. A further challenge concerns…
Super-resolution light microscopy overcomes the physical barriers due to light diffraction, allowing for the observation of otherwise indistinguishable subcellular entities. However, the specific acquisition conditions required by…
We report the fabrication and performance evaluation of single crystal diamond refractive x-ray lenses with a paraboloid of rotation form factor for focusing x-rays in two dimensions simultaneously. The lenses were manufactured using a…
Conventional x-ray imaging detectors suffer from parallax error when the radiation beam arrives at the detector surface at tilted angle. The image blurring occurs as the radiation penetrates detector material in lateral direction at tilted…
One of the problems often encountered in X-ray mirror manufacturing is setting proper manufacturing tolerances to guarantee an angular resolution - often expressed in terms of Point Spread Function (PSF) - as needed by the specific science…
We introduce a rapid data acquisition and reconstruction method to image the crystalline structure of materials and associated strain and orientations at micrometer resolution using Laue diffraction. Our method relies on scanning a…
X-ray diffraction is ideal for probing sub-surface state during complex or rapid thermomechanical loading of crystalline materials. However, challenges arise as the size of diffraction volumes increases due to spatial broadening and…
In single-molecule microscopy it is necessary to locate with high precision point sources from noisy observations of the spectrum of the signal at frequencies capped by $f_c$, which is just about the frequency of natural light. This paper…
Single molecule X-ray scattering experiments using free electron lasers hold the potential to resolve both single structures and structural ensembles of biomolecules. However, molecular electron density determination has so far not been…
A new method for solving small X-ray structures with up to couple of hundreds of atoms in the unit cell has been developed. The method works by locating atoms one-by-one via global minimization of a newly defined single-atom R1 factor in…
In some super-resolution techniques, adjacent points are illuminated at different times. Thereby, their locations and light intensities can be detected even if the images are very blurred due to diffraction. According to conventional…
Coherent x-ray diffractive imaging is extended to high resolution strain analysis in crystalline nanostructured devices. The application potential is demonstrated by determining the strain distribution in (Ga,Mn)As/GaAs nanowires. By…
In high energy resolution X-ray spectroscopy beamlines of synchrotron radiation facilities, it is important to keep X-ray spectrometer operating in optimal conditions. The adjusting process is normally very time consuming due to the…
Radiation damage is considered to be the major problem that still prevents imaging an individual biological molecule for structural analysis. So far, all known mapping techniques using sufficient short wave-length radiation, be it X-rays or…
X-ray dark-field imaging creates a representation of the sample where contrast is generated by subresolution features within the volume under inspection. These are detected by a local measurement of the radiation field's angular…
The lateral resolution of an X-ray photoelectron spectroscopy instrument, which is equipped with a focused X-ray beam, is limited by the nominal X-ray beam diameter and the long tail intensity distri-bution of the X-ray beam. The long tail…
X-ray interferometry provides valuable information in terms of attenuation, small-angle scatter, and differential phase contrast. This multi-modal contrast can aid in many clinical applications, such as lung diseases and breast cancer.…
Nanoprobe X-ray diffraction (nXRD) using focused synchrotron radiation is a powerful technique to study the structural properties of individual semiconductor nanowires. However, when performing the experiment under ambient conditions, the…
Powder X-ray diffraction analysis is a critical component of materials characterization methodologies. Discerning characteristic Bragg intensity peaks and assigning them to known crystalline phases is the first qualitative step of…
Scanning Electron Microscopy (SEM) is pivotal in revealing intricate micro- and nanoscale features across various research fields. However, obtaining high-resolution SEM images presents challenges, including prolonged scanning durations and…