R Springell

This work describes a methodology for producing high quality metallic surfaces from uranium primarily for characterisation and investigations involving electron backscatter diffraction. Electrochemical measurements have been conducted to…

Poly- and single-crystal thin films of U-Mo alloys have been grown both on glass and sapphire substrates by UHV magnetron sputtering. X-ray and Electron Backscatter Diffraction data indicate that for single-crystal U1-xMox alloys, the pure…

This report presents azimuthal dependent and polarisation dependent x-ray resonant magnetic scattering at the Ir L3 edge for the bilayered iridate compound, Sr3Ir2O7. Two magnetic wave vectors, k1=(1/2,1/2,0) and k2=(1/2,-1/2,0), result in…

SQUID magnetometry and polarised neutron reflectivity measurements have been employed to characterise the magnetic properties of U/Fe, U/Co and U/Gd multilayers. The field dependence of the magnetisation was measured at 10K in magnetic…

This paper addresses the structural characterisation of a series of U/Fe, U/Co and U/Gd multilayers. X-ray reflectivity has been employed to investigate the layer thickness and roughness parameters along the growth direction and high-angle…