Experimental plots of the fraction of detected electrons removed from the zero-loss peak, versus the fraction of incident electrons scattered outside of the objective aperture, can serve as a robust fingerprint of object-contrast in an energy filtered transmission electron microscope (EFTEM). Examples of this, along with the first in a series of models for interpreting the resulting patterns, were presented at the August 2010 meeting of the Microscope Society of America meeting in Portland, Oregon, and published in {\em Microscopy and MicroAnalysis} {\bf 16}, Supplement 2, pages 1534-1535 by Cambridge University Press.
@article{arxiv.1203.6342,
title = {Zero-loss/deflection map analysis},
author = {P. Fraundorf and K. Pisane and E. Mandell and R. Collins},
journal= {arXiv preprint arXiv:1203.6342},
year = {2015}
}