As emerging topological nodal-line semimetals, the family of ZrSiX (X = O, S, Se, Te) has attracted broad interests in condensed matter physics due to their future applications in spintonics. Here, we apply a scanning tunneling microscopy (STM) to study the structural symmetry and electronic topology of ZrSiSe. The glide mirror symmetry is verified by quantifying the lattice structure of the ZrSe bilayer based on bias selective topographies. The quasiparticle interference analysis is used to identify the band structure of ZrSiSe. The nodal line is experimentally determined at ∼ 250 meV above the Fermi level. An extra surface state Dirac point at ∼ 400 meV below the Fermi level is also determined. Our STM measurement provides a direct experimental evidence of the nodal-line state in the family of ZrSiX.
@article{arxiv.1801.09979,
title = {Visualization of electronic topology in ZrSiSe by scanning tunneling microscopy},
author = {Kunliang Bu and Ying Fei and Wenhao Zhang and Yuan Zheng and Jianlan Wu and Fangchu Chen and Xuan Luo and Yuping Sun and Qiunan Xu and Xi Dai and Yi Yin},
journal= {arXiv preprint arXiv:1801.09979},
year = {2018}
}