Advanced microwave technologies constitute the foundation of a wide range of modern sciences, including quantum computing, microwave photonics, spintronics, etc. To facilitate the design of chip-based microwave devices, there is an increasing demand for state-of-the-art microscopic techniques capable of characterizing the near-field microwave distribution and performance. In this work, we integrate Josephson junctions onto a nano-sized quartz tip, forming a highly sensitive microwave mixer on-tip. This allows us to conduct spectroscopic imaging of near-field microwave distributions with high spatial resolution. Leveraging its microwave-sensitive characteristics, our Josephson microscope achieves a broad detecting bandwidth of up to 200 GHz with remarkable frequency and intensity sensitivities. Our work emphasizes the benefits of utilizing the Josephson microscope as a real-time, non-destructive technique to advance integrated microwave electronics.
@article{arxiv.2401.12545,
title = {Ultra-broadband near-field Josephson microwave microscopy},
author = {Ping Zhang and Yang-Yang Lyu and Jingjing Lv and Zihan Wei and Shixian Chen and Chenguang Wang and Hongmei Du and Dingding Li and Zixi Wang and Shoucheng Hou and Runfeng Su and Hancong Sun and Yuan Du and Li Du and Liming Gao and Yong-Lei Wang and Huabing Wang and Peiheng Wu},
journal= {arXiv preprint arXiv:2401.12545},
year = {2024}
}