English

Transferable Deep Metric Learning for Clustering

Machine Learning 2023-02-14 v1 Artificial Intelligence Computer Vision and Pattern Recognition

Abstract

Clustering in high dimension spaces is a difficult task; the usual distance metrics may no longer be appropriate under the curse of dimensionality. Indeed, the choice of the metric is crucial, and it is highly dependent on the dataset characteristics. However a single metric could be used to correctly perform clustering on multiple datasets of different domains. We propose to do so, providing a framework for learning a transferable metric. We show that we can learn a metric on a labelled dataset, then apply it to cluster a different dataset, using an embedding space that characterises a desired clustering in the generic sense. We learn and test such metrics on several datasets of variable complexity (synthetic, MNIST, SVHN, omniglot) and achieve results competitive with the state-of-the-art while using only a small number of labelled training datasets and shallow networks.

Keywords

Cite

@article{arxiv.2302.06523,
  title  = {Transferable Deep Metric Learning for Clustering},
  author = {Simo Alami. C and Rim Kaddah and Jesse Read},
  journal= {arXiv preprint arXiv:2302.06523},
  year   = {2023}
}

Comments

Published in Symposium of Intelligent Data Analysis (IDA), 2023

R2 v1 2026-06-28T08:39:00.315Z