English

Deep Metric Learning via Facility Location

Computer Vision and Pattern Recognition 2017-04-12 v2 Machine Learning

Abstract

Learning the representation and the similarity metric in an end-to-end fashion with deep networks have demonstrated outstanding results for clustering and retrieval. However, these recent approaches still suffer from the performance degradation stemming from the local metric training procedure which is unaware of the global structure of the embedding space. We propose a global metric learning scheme for optimizing the deep metric embedding with the learnable clustering function and the clustering metric (NMI) in a novel structured prediction framework. Our experiments on CUB200-2011, Cars196, and Stanford online products datasets show state of the art performance both on the clustering and retrieval tasks measured in the NMI and Recall@K evaluation metrics.

Keywords

Cite

@article{arxiv.1612.01213,
  title  = {Deep Metric Learning via Facility Location},
  author = {Hyun Oh Song and Stefanie Jegelka and Vivek Rathod and Kevin Murphy},
  journal= {arXiv preprint arXiv:1612.01213},
  year   = {2017}
}

Comments

Submission accepted at CVPR 2017

R2 v1 2026-06-22T17:13:08.859Z