English

Topological phase transition and two dimensional topological insulators in Ge-based thin films

Mesoscale and Nanoscale Physics 2014-02-12 v1

Abstract

We discuss possible topological phase transitions in Ge-based thin films of Ge(Bix_xSb1x_{1-x})2_2Te4_4 as a function of layer thickness and Bi concentration xx using the first principles density functional theory framework. The bulk material is a topological insulator at xx = 1.0 with a single Dirac cone surface state at the surface Brillouin zone center, whereas it is a trivial insulator at xx = 0. Through a systematic examination of the band topologies we predict that thin films of Ge(Bix_xSb1x_{1-x})2_2Te4_4 with xx = 0.6, 0.8 and 1.0 are candidates for two-dimensional (2D) topological insulators, which would undergo a 2D topological phase transition as a function of xx. A topological phase diagram for Ge(Bix_xSb1x_{1-x})2_2Te4_4 thin films is presented to help guide their experimental exploration.

Keywords

Cite

@article{arxiv.1312.0379,
  title  = {Topological phase transition and two dimensional topological insulators in Ge-based thin films},
  author = {Bahadur Singh and Hsin Lin and R. Prasad and A. Bansil},
  journal= {arXiv preprint arXiv:1312.0379},
  year   = {2014}
}

Comments

7 pages, 5 figures, Accepted for publication in Physical Review B (2012)