We discuss possible topological phase transitions in Ge-based thin films of Ge(BixSb1−x)2Te4 as a function of layer thickness and Bi concentration x using the first principles density functional theory framework. The bulk material is a topological insulator at x = 1.0 with a single Dirac cone surface state at the surface Brillouin zone center, whereas it is a trivial insulator at x = 0. Through a systematic examination of the band topologies we predict that thin films of Ge(BixSb1−x)2Te4 with x = 0.6, 0.8 and 1.0 are candidates for two-dimensional (2D) topological insulators, which would undergo a 2D topological phase transition as a function of x. A topological phase diagram for Ge(BixSb1−x)2Te4 thin films is presented to help guide their experimental exploration.
@article{arxiv.1312.0379,
title = {Topological phase transition and two dimensional topological insulators in Ge-based thin films},
author = {Bahadur Singh and Hsin Lin and R. Prasad and A. Bansil},
journal= {arXiv preprint arXiv:1312.0379},
year = {2014}
}
Comments
7 pages, 5 figures, Accepted for publication in Physical Review B (2012)