Tilting refractive x-ray lenses for fine-tuning their focal length
Optics
2023-01-18 v1 Instrumentation and Detectors
Abstract
In this work, we measure and model tilted x-ray refractive lenses to investigate their effects on an x-ray beam. The modelling is benchmarked against at-wavelength metrology obtained with x-ray speckle vector tracking experiments (XSVT) at the BM05 beamline at the ESRF-EBS light source, showing very good agreement. This validation permits us to explore possible applications of tilted x-ray lenses in optical design: we demonstrate that tilting 1D lenses around their focusing direction can be used for fine-tuning their focal length with possible applications in beamline optical design.
Keywords
Cite
@article{arxiv.2211.11621,
title = {Tilting refractive x-ray lenses for fine-tuning their focal length},
author = {Rafael Celestre and Thomas Roth and Carsten Detlefs and Peng Qi and Marco Cammarata and Manuel Sanchez del Rio and Raymond Barrett},
journal= {arXiv preprint arXiv:2211.11621},
year = {2023}
}
Comments
15 pages, 13 figures, 38 references to be submitted to Optics Express