Super-Resolution Structured-Illumination X-Ray Microscopy based on Fourier Decomposition
Abstract
We present a structured-illumination technique for full-field super-resolution transmission X-ray microscopy, which employs Fourier spectral decomposition inspired by established methods in visible-light microscopy. A 2D grating creating this illumination is stepped across one period to acquire a set of images at unique illumination positions. The Fourier domain of each image is described as a linear combination of replicated sample information at each frequency harmonic. As this superposition is created independently of detection, it contains spatial information exceeding native detector resolution. Recovering the encoded high-frequency components enables the population of an expanded frequency space. We demonstrate the presence of additional sample information in the Fourier spectrum and introduce a method to recover it. We achieve a resolution improvement by a factor of 2.2 for the projection image of a resolution test pattern. We further demonstrate seamless integration into standard X-ray tomography acquisition schemes. The acquisition is inherently multimodal, as phase-contrast and dark-field images can be computed from the same data using methods such as unified modulated pattern analysis, while providing an additional super-resolved transmission channel. These results indicate broad potential for non-destructive testing and biomedical imaging, as they alleviate pixel-size limitations in photon-counting detectors and sample-size restrictions imposed by optical magnification.
Cite
@article{arxiv.2602.18343,
title = {Super-Resolution Structured-Illumination X-Ray Microscopy based on Fourier Decomposition},
author = {Stefan Schwaiger and Lennart Forster and Martin Dierolf and Franz Pfeiffer and Benedikt Günther},
journal= {arXiv preprint arXiv:2602.18343},
year = {2026}
}