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Study of domain switching using piezoresponse force microscopy in Ca0.4Sr0.6Bi4Ti4O15 thin film for electromechanical applications

Materials Science 2025-05-02 v1

Abstract

An attempt has been made to synthesize (Ca0.4Sr0.6)Bi4Ti4O15(CSBT) thin film using pulsed laser deposition (PLD) and successfully optimized the deposition conditions. A good quality film with the desired phase is obtained at a substrate temperature of 650 oC based on phase, composition and morphology studies. Highly c-axis oriented films with average thickness 330-400 nm and an average grain size 40-65 nm has been found. Piezoresponse force microscopy (PFM) showed a complete domain reversal using switching spectroscopy. A comparatively high effective d33* value as ~120 pm/V has been achived. The results suggest that CSBT has a great potential in electromechanical applications.

Keywords

Cite

@article{arxiv.1810.02192,
  title  = {Study of domain switching using piezoresponse force microscopy in Ca0.4Sr0.6Bi4Ti4O15 thin film for electromechanical applications},
  author = {Supratim Mitra and Satakshi Gupta and Aneesh M. Joseph and Umesh Kumar Dwivedi},
  journal= {arXiv preprint arXiv:1810.02192},
  year   = {2025}
}

Comments

14 pages, 4 figures