Co2MnSi (CMS) films of different thicknesses (20, 50 and 100 nm) were grown by radio frequency (RF) sputtering on a-plane sapphire substrates. Our X-rays diffraction study shows that, in all the samples, the cubic <110> CSM axis is normal to the substrate and that there exist well defined preferential in-plane orientations. Static and dynamic magnetic properties were investigated using vibrating sample magnetometry (VSM) and micro-strip line ferromagnetic resonance (MS-FMR), respectively. From the resonance measurements versus the direction and the amplitude of an applied magnetic field we derive most of the magnetic parameters: magnetization, gyromagnetic factor, exchange stiffness coefficient and magnetic anisotropy terms. The in-plane anisotropy can be described as resulting from the superposition of two terms showing a two-fold and a four-fold symmetry without necessarily identical principal axes. The observed behavior of the hysteresis loops is in agreement with this complex form of the in-plane anisotropy
@article{arxiv.1012.3837,
title = {Structural and magnetic properties of Co2MnSi thin films},
author = {Mohamed Belmeguenai and Fatih Zighem and Damien Faurie and Salim Mourad Chérif and Philippe Moch and Kurt Westerholt and Wilfrid Seiler},
journal= {arXiv preprint arXiv:1012.3837},
year = {2013}
}
Comments
7 pages, 5 figures, submitted to Journal of Physics: Condensed Matter