Steplike intensity threshold behavior of extreme ionization in laser-driven Xe clusters
Atomic and Molecular Clusters
2010-08-30 v3
Abstract
The generation of highly charged Xe ions up to {} is observed in Xe clusters embedded in helium nanodroplets and exposed to intense femtosecond laser pulses (=800 nm). Laser intensity resolved measurements show that the high- ion generation starts at an unexpectedly low threshold intensity of about {10 W/cm}. Above threshold, the Xe ion charge spectrum saturates quickly and changes only weakly for higher laser intensities. Good agreement between these observations and a molecular dynamics analysis allows us to identify the mechanisms responsible for the highly charged ion production and the surprising intensity threshold behavior of the ionization process.
Cite
@article{arxiv.0908.2145,
title = {Steplike intensity threshold behavior of extreme ionization in laser-driven Xe clusters},
author = {T. Döppner and J. P. Müller and A. Przystawik and S. Göde and J. Tiggesbäumker and K. -H. Meiwes-Broer and C. Varin and L. Ramunno and T. Brabec and T. Fennel},
journal= {arXiv preprint arXiv:0908.2145},
year = {2010}
}
Comments
4 pages, 4 figures, content revised