Low intensity threshold values for keV X-ray production in laser-cluster interaction
Atomic and Molecular Clusters
2007-05-23 v1 Atomic Physics
Abstract
Absolute Ar XK (3 keV) and Xe XL (4 keV) photon yields are measured as a function of laser peak intensity, for large (104 - 105 atoms) argon and xenon clusters submitted to intense laser pulses. A clear threshold behavior is observed. The intensity threshold is found as low as 2 1014 Wcm-2, a value matching the production of singly-charged argon or doubly-charged xenon by optical field ionization. Possible mechanisms involved in the inner-shell ionization are discussed. The outcome on the optimization of keV X-ray production is underlined.
Cite
@article{arxiv.physics/0507042,
title = {Low intensity threshold values for keV X-ray production in laser-cluster interaction},
author = {C. Prigent and L. Adoui and E. Lamour and J. -P. Rozet and D. Vernhet and O. Gobert and P. Meynadier and D. Normand and M. Perdrix},
journal= {arXiv preprint arXiv:physics/0507042},
year = {2007}
}
Comments
1 table, 4 figures. submitted to Physical Review Letters