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Statistical Model Criticism of Variational Auto-Encoders

Machine Learning 2022-04-08 v1 Computer Vision and Pattern Recognition Machine Learning

Abstract

We propose a framework for the statistical evaluation of variational auto-encoders (VAEs) and test two instances of this framework in the context of modelling images of handwritten digits and a corpus of English text. Our take on evaluation is based on the idea of statistical model criticism, popular in Bayesian data analysis, whereby a statistical model is evaluated in terms of its ability to reproduce statistics of an unknown data generating process from which we can obtain samples. A VAE learns not one, but two joint distributions over a shared sample space, each exploiting a choice of factorisation that makes sampling tractable in one of two directions (latent-to-data, data-to-latent). We evaluate samples from these distributions, assessing their (marginal) fit to the observed data and our choice of prior, and we also evaluate samples through a pipeline that connects the two distributions starting from a data sample, assessing whether together they exploit and reveal latent factors of variation that are useful to a practitioner. We show that this methodology offers possibilities for model selection qualitatively beyond intrinsic evaluation metrics and at a finer granularity than commonly used statistics can offer.

Keywords

Cite

@article{arxiv.2204.03030,
  title  = {Statistical Model Criticism of Variational Auto-Encoders},
  author = {Claartje Barkhof and Wilker Aziz},
  journal= {arXiv preprint arXiv:2204.03030},
  year   = {2022}
}
R2 v1 2026-06-24T10:40:19.573Z