Specular Andreev reflection in thin films of topological insulators
Abstract
We theoretically reveal the possibility of specular Andreev reflection in a thin film topological insulator normal-superconductor (N/S) junction in the presence of a gate electric field. The probability of specular Andreev reflection increases with the electric field, and electron-hole conversion with unit efficiency happens in a wide experimentally accessible range of the electric field. We show that perfect specular Andreev reflection can occur for all angles of incidence with a particular excitation energy value. In addition, we find that the thermal conductance of the structure displays exponential dependence on the temperature. Our results reveal the potential of the proposed topological insulator thin-film-based N/S structure for the realization of intraband specular Andreev reflection.
Keywords
Cite
@article{arxiv.1511.09221,
title = {Specular Andreev reflection in thin films of topological insulators},
author = {Leyla Majidi and Reza Asgari},
journal= {arXiv preprint arXiv:1511.09221},
year = {2016}
}
Comments
10 pages, 9 figures. Some typos are corrected