English

Proximity effects and Andreev reflection in mesoscopic SNS junction with perfect NS interfaces

Superconductivity 2010-11-09 v1 Mesoscale and Nanoscale Physics

Abstract

Low temperature transport measurements on superconducting film - normal metal wire - superconducting film (SNS) junctions fabricated on the basis of 6 nm thick superconducting polycrystalline PtSi films are reported. The structures with the normal metal wires of two different lengths L=1.5 μ\mum and L=6μ\mum and the same widths W=0.3μ\mum are studied. Zero bias resistance dip related to pair current proximity effect is observed for all junctions whereas the subharmonic energy gap structure originating from phase coherent multiple Andreev reflections have occurs only in the SNS junctions with short wires.

Keywords

Cite

@article{arxiv.cond-mat/9907247,
  title  = {Proximity effects and Andreev reflection in mesoscopic SNS junction with perfect NS interfaces},
  author = {Z. D. Kvon and T. I. Baturina and R. A. Donaton and M. R. Baklanov and K. Maex and E. B. Olshanetsky and A. E. Plotnikov and J. C. Portal},
  journal= {arXiv preprint arXiv:cond-mat/9907247},
  year   = {2010}
}

Comments

ReVTex, 4 pages, 4 eps figures included