Solid-State Dewetting of Polycrystalline Thin Films: a Phase Field Approach
Abstract
Solid-state dewetting is the process by which thin solid films break up and retract on a substrate, forming nanostructures. While dewetting of single-crystalline films is understood as a surface-energy-driven process mediated by surface diffusion, polycrystalline films exhibit additional complexity due to the presence of grain boundaries. Most theoretical and computational studies have focused on single-crystalline dewetting. Here, we present the application of the grandpotential multi-phase-field model to the dewetting of thin polycrystalline films in three dimensions, reproducing the key phenomenology of this process. By considering isotropic interface/surface energy, we illustrate its consistency with predictions based on energetic arguments and the morphological evolution towards equilibrium. We also provide novel analytical criteria for the onset of three-dimensional dewetting, serving as fundamental theoretical benchmarks, and highlight the critical role of triple junctions. Moreover, we unveil the dewetting behavior of polycrystalline patches, extending the scenarios of their single-crystalline counterparts.
Keywords
Cite
@article{arxiv.2507.10811,
title = {Solid-State Dewetting of Polycrystalline Thin Films: a Phase Field Approach},
author = {Paul Hoffrogge and Nils Becker and Daniel Schneider and Britta Nestler and Axel Voigt and Marco Salvalaglio},
journal= {arXiv preprint arXiv:2507.10811},
year = {2026}
}
Comments
7 pages, 4 figures. Supplemental Material Included (3 pages, 1 figure)