English

Soft X-ray Angle Resolved Photoemission with Micro Positioning Techniques for Metallic V$_2$O$_3$

Strongly Correlated Electrons 2015-03-30 v2

Abstract

We have performed soft-X-ray angle resolved photoemission for metallic V2_2O3_3. Combining a micro focus beam (40 x 65 μ{\mu}m2^2) and micro positioning techniques with a long working distance microscope, we have succeeded in observing band dispersions from tiny cleavage surfaces with typical size of the several tens of μ{\mu}m. The photoemission spectra show a clear position dependence reflecting the morphology of the cleaved sample surface. By selecting high quality flat regions on the sample surface, we have succeeded in band mapping using both photon-energy and polar-angle dependences, opening the door to three-dimensional ARPES for typical three dimensional correlated materials where large cleavage planes are rarely obtained.

Keywords

Cite

@article{arxiv.1503.07779,
  title  = {Soft X-ray Angle Resolved Photoemission with Micro Positioning Techniques for Metallic V$_2$O$_3$},
  author = {H. Fujiwara and T. Kiss and Y. K. Wakabayashi and Y. Nishitani and T. Mori and Y. Nakata and S. Kitayama and K. Fukushima and S. Ikeda and H. Fuchimoto and Y. Minowa and S. -K. Mo and J. D. Denlinger and J. W. Allen and P. Metcalf and M. Imai and K. Yoshimura and S. Suga and T. Muro and A. Sekiyama},
  journal= {arXiv preprint arXiv:1503.07779},
  year   = {2015}
}

Comments

5 pages, 4 figures, to be published in Journal of Synchrotron Radiation

R2 v1 2026-06-22T09:03:00.040Z