Layer dependent band dispersion and correlations using tunable Soft X-ray ARPES

N. Kamakura; Y. Takata; T. Tokushima; Y. Harada; A. Chainani; K. Kobayashi; S. Shin

doi:10.1209/epl/i2004-10052-6

Layer dependent band dispersion and correlations using tunable Soft X-ray ARPES

Strongly Correlated Electrons 2009-11-10 v2 Materials Science

Authors: N. Kamakura , Y. Takata , T. Tokushima , Y. Harada , A. Chainani , K. Kobayashi , S. Shin

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Abstract

Soft X-ray Angle-Resolved Photoemission Spectroscopy is applied to study in-plane band dispersions of Nickel as a function of probing depth. Photon energies between 190 and 780 eV were used to effectively probe up to 3-7 layers. The results show layer dependent band dispersion of the Delta_2 minority-spin band which crosses the Fermi level in 3 or more layers, in contrast to known top 1-2 layers dispersion obtained using ultra-violet rays. The layer dependence corresponds to an increased value of exchange splitting and suggests reduced correlation effects in the bulk compared to the surface.

Keywords

angle-resolved photoemission spectroscopy fermi surface optical microscopy and spectroscopy

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@article{arxiv.cond-mat/0311547,
  title  = {Layer dependent band dispersion and correlations using tunable Soft X-ray ARPES},
  author = {N. Kamakura and Y. Takata and T. Tokushima and Y. Harada and A. Chainani and K. Kobayashi and S. Shin},
  journal= {arXiv preprint arXiv:cond-mat/0311547},
  year   = {2009}
}

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7 pages, 3 figures Revised text and figure

Layer dependent band dispersion and correlations using tunable Soft X-ray ARPES

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