English

Silicon intercalation into the graphene-SiC interface

Mesoscale and Nanoscale Physics 2015-06-03 v1

Abstract

In this work we use LEEM, XPEEM and XPS to study how the excess Si at the graphene-vacuum interface reorders itself at high temperatures. We show that silicon deposited at room temperature onto multilayer graphene films grown on the SiC(000[`1]) rapidly diffuses to the graphene-SiC interface when heated to temperatures above 1020. In a sequence of depositions, we have been able to intercalate ~ 6 ML of Si into the graphene-SiC interface.

Keywords

Cite

@article{arxiv.1111.2946,
  title  = {Silicon intercalation into the graphene-SiC interface},
  author = {F. Wang and K. Shepperd and J. Hicks and M. S. Nevius and H. Tinkey and A. Tejeda and A. Taleb-Ibrahimi and F. Bertran and P. Le F`evre and D. B. Torrance and P. First and W. A. de Heer and A. A. Zakharov and E. H. Conrad},
  journal= {arXiv preprint arXiv:1111.2946},
  year   = {2015}
}

Comments

6 pages, 8 figures, submitted to PRB

R2 v1 2026-06-21T19:35:10.064Z