English

Signatures of Valley Kondo Effect in Si/SiGe Quantum Dots

Mesoscale and Nanoscale Physics 2014-07-04 v2

Abstract

We report measurements consistent with the valley Kondo effect in Si/SiGe quantum dots, evidenced by peaks in the conductance versus source-drain voltage that show strong temperature dependence. The Kondo peaks show unusual behavior in a magnetic field that we interpret as arising from the valley degree of freedom. The interplay of valley and Zeeman splittings is suggested by the presence of side peaks, revealing a zero-field valley splitting between 0.28 to 0.34 meV. A zero-bias conductance peak for non-zero magnetic field, a phenomenon consistent with valley non- conservation in tunneling, is observed in two samples.

Keywords

Cite

@article{arxiv.1212.0918,
  title  = {Signatures of Valley Kondo Effect in Si/SiGe Quantum Dots},
  author = {Mingyun Yuan and R. Joynt and Zhen Yang and Chunyang Tang and D. E. Savage and M. G. Lagally and M. A. Eriksson and A. J. Rimberg},
  journal= {arXiv preprint arXiv:1212.0918},
  year   = {2014}
}

Comments

16 pages, 7 figures