Shot Noise of a Temperature-Biased Tunnel Junction
Mesoscale and Nanoscale Physics
2020-09-09 v1
Abstract
We report the measurement of the current noise of a tunnel junction driven out-of-equilibrium by a temperature and/or voltage difference, i.e. the charge noise of heat and/or electrical current. This is achieved by a careful control of electron temperature below 1 K at the nanoscale, and a sensitive measurement of noise with wide bandwidth, from 0.1 to 1 GHz. An excellent agreement between experiment and theory with no fitting parameter is obtained. In particular, we find that the current noise of the junction of resistance R when one electrode is at temperature T and the other one at zero temperature is given by S = 2 ln2 kB T /R.
Keywords
Cite
@article{arxiv.2002.10339,
title = {Shot Noise of a Temperature-Biased Tunnel Junction},
author = {Samuel Larocque and Edouard Pinsolle and Christian Lupien and Bertrand Reulet},
journal= {arXiv preprint arXiv:2002.10339},
year = {2020}
}
Comments
5 pages, 4 figures