Self-referenced prism deflection measurement schemes with microradian precision
Optics
2009-11-11 v1
Abstract
We have demonstrated several inexpensive methods which can be used to measure the deflection angles of prisms with microradian precision. The methods are self-referenced, using various reversals to achieve absolute measurements without the need of a reference prism or any expensive precision components other than the prisms under test. These techniques are based on laser interferometry and have been used in our lab to characterize parallel-plate beamsplitters, penta prisms, right angle prisms, and corner cube reflectors using only components typically available in an optics lab.
Cite
@article{arxiv.physics/0509264,
title = {Self-referenced prism deflection measurement schemes with microradian precision},
author = {Rebecca Olson and Justin Paul and Scott Bergeson and Dallin S. Durfee},
journal= {arXiv preprint arXiv:physics/0509264},
year = {2009}
}
Comments
10 pages, 9 figures