Scalable probes of measurement-induced criticality
Abstract
We uncover a local order parameter for measurement-induced phase transitions: the average entropy of a single reference qubit initially entangled with the system. Using this order parameter, we identify scalable probes of measurement-induced criticality (MIC) that are immediately applicable to advanced quantum computing platforms. We test our proposal on a 1+1 dimensional stabilizer circuit model that can be classically simulated in polynomial time. We introduce the concept of a "decoding light cone" to establish the local and efficiently measurable nature of this probe. We also estimate bulk and surface critical exponents for the transition. Developing scalable probes of MIC in more general models may be a useful application of noisy-intermediate scale quantum (NISQ) devices, as well as point to more efficient realizations of fault-tolerant quantum computation.
Keywords
Cite
@article{arxiv.1910.00020,
title = {Scalable probes of measurement-induced criticality},
author = {Michael J. Gullans and David A. Huse},
journal= {arXiv preprint arXiv:1910.00020},
year = {2020}
}
Comments
6 pages, 3 figures, v2 added Figure 2 and supplement