Instrumentation and Detectors · Physics
Calibrating coordinate system alignment in a scanning transmission electron microscope using a digital twin
Dieter Weber, David Landers, Chen Huang, Emanuela Liberti +8
2024-03-14
Instrumentation and Detectors · Physics
Emittance Minimization for Aberration Correction I: Aberration correction of an electron microscope without knowing the aberration coefficients
Desheng Ma, Steven E. Zeltmann, Chenyu Zhang, Zhaslan Baraissov +5
2024-12-31
Instrumentation and Detectors · Physics
Emittance Minimization for Aberration Correction II: Physics-informed Bayesian Optimization of an Electron Microscope
Desheng Ma, Steven E. Zeltmann, Chenyu Zhang, Zhaslan Baraissov +5
2025-01-27
Instrumentation and Detectors · Physics
Near-real-time diagnosis of electron optical phase aberrations in scanning transmission electron microscopy using an artificial neural network
Giovanni Bertoni, Enzo Rotunno, Daan Marsmans, Peter Tiemeijer +3
2023-01-04
Signal Processing · Electrical Eng. & Systems
Fast Simulation of Damage Diffusion Distribution in Scanning Transmission Electron Microscopy
Amir Javadi Rad, Amirafshar Moshtaghpour, Dongdong Chen, Angus I. Kirkland
2025-07-02
Materials Science · Physics
Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy
Stephanie M. Ribet, Steven E. Zeltmann, Karen C. Bustillo, Rohan Dhall +5
2023-03-20
Instrumentation and Detectors · Physics
An Accessible Method for Simulating Charged-Particle Optics, with Examples for Transmission Electron Microscopy
Patrick McBean, Zachary Milne, Arjun Kanthawar, Cameron O'Byrne +2
2022-12-07
Materials Science · Physics
A Fast Algorithm for Scanning Transmission Electron Microscopy (STEM) Imaging and 4D-STEM Diffraction Simulations
Philipp M Pelz, Alexander Rakowski, Luis Rangel DaCosta, Benjamin H Savitzky +2
2021-09-01
Computer Vision and Pattern Recognition · Computer Science
Signal Processing Challenges and Examples for {\it in-situ} Transmission Electron Microscopy
Josh Kacher, Yao Xie, Sven P. Voigt, Shixiang Zhu +3
2021-08-24
Data Analysis, Statistics and Probability · Physics
Optimal STEM Convergence Angle Selection using a Convolutional Neural Network and the Strehl Ratio
Noah Schnitzer, Suk Hyun Sung, Robert Hovden
2020-10-29
Materials Science · Physics
Real-space tilting method for atomic resolution STEM imaging of nanocrystalline materials
Jiake Wei, Zhangze Xu, Wenjie Shen, Bin Feng +4
2024-06-04
Mesoscale and Nanoscale Physics · Physics
Learning and Controlling Silicon Dopant Transitions in Graphene using Scanning Transmission Electron Microscopy
Max Schwarzer, Jesse Farebrother, Joshua Greaves, Ekin Dogus Cubuk +7
2023-11-30
Distributed, Parallel, and Cluster Computing · Computer Science
Enabling Autonomous Electron Microscopy for Networked Computation and Steering
Anees Al-Najjar, Nageswara S. V. Rao, Ramanan Sankaran, Maxim Ziatdinov +5
2022-10-19
Computer Vision and Pattern Recognition · Computer Science
Noise Calibration and Spatial-Frequency Interactive Network for STEM Image Enhancement
Hesong Li, Ziqi Wu, Ruiwen Shao, Tao Zhang +1
2025-04-04
Instrumentation and Detectors · Physics
Alignment of electron optical beam shaping elements using a convolutional neural network
E. Rotunno, A. H. Tavabi, P. Rosi, S. Frabboni +3
2021-01-13
Instrumentation and Detectors · Physics
Compressed Sensing of Scanning Transmission Electron Microscopy (STEM) on Non-Rectangular Scans
Xin Li, Ondrej Dyck, Sergei V. Kalinin, Stephen Jesse
2019-01-15
Physics Education · Physics
An educational website on interferometry
Veena Singh, Richa Dubey, P. K. Panigrahi, K. Muralidhar
2018-03-02
Signal Processing · Electrical Eng. & Systems
Compressive Scanning Transmission Electron Microscopy
Daniel Nicholls, Alex Robinson, Jack Wells, Amirafshar Moshtaghpour +3
2021-12-23
Materials Science · Physics
Identification and Correction of Temporal and Spatial Distortions in Scanning Transmission Electron Microscopy
Kevin M. Roccapriore, Nicole Creange, Maxim Ziatdinov, Sergei V. Kalinin
2021-10-05
Disordered Systems and Neural Networks · Physics
Probing electron beam induced transformations on a single defect level via automated scanning transmission electron microscopy
Kevin M. Roccapriore, Matthew G. Boebinger, Ondrej Dyck, Ayana Ghosh +3
2022-07-27
Materials Science · Physics
St4DeM: A software suite for multi-modal 4D-STEM acquisition techniques
Toni Uusimaeki, Cheuk-Wai Tai, Tom Willhammar, Thomas Thersleff +4
2025-04-29
Instrumentation and Detectors · Physics
Development of a fast electromagnetic shutter for compressive sensing imaging in scanning transmission electron microscopy
Armand Béché, Bart Goris, Bert Freitag, Jo Verbeeck
2016-03-23