An unparalleled resolution is reported with an inelastic x-ray scattering instrument at the Cu K-edge. Based on a segmented concave analyzer, featuring single crystal quartz (SiO_{2}) pixels, the spectrometer delivers a resolution near 25 meV (FWHM) at 8981 eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick-Baez optics. The measured resolution agrees with the ray tracing simulation of an ideal spectrometer. We demonstrated the performance of the spectrometer by reproducing the phonon dispersion curve of a beryllium (Be) single crystal.
@article{arxiv.1412.4484,
title = {Resonant inelastic x-ray scattering spectrometer with 25 meV resolution at Cu K-edge},
author = {Didem Ketenoglu and Manuel Harder and Konstantin Klementiev and Mary Upton and Mehran Taherkhani and Manfred Spiwek and Frank-Uwe Dill and Hans-Christian Wille and Hasan Yavaş},
journal= {arXiv preprint arXiv:1412.4484},
year = {2015}
}