English

Resonance-enhanced multiphoton ionization in the x-ray regime

Atomic Physics 2021-12-01 v2 Optics

Abstract

Here, we report on the nonlinear ionization of argon atoms in the short wavelength regime using ultraintense x rays from the European XFEL. After sequential multiphoton ionization, high charge states are obtained. For photon energies that are insufficient to directly ionize a 1s1s electron, a different mechanism is required to obtain ionization to Ar17+^{17+}. We propose this occurs through a two-color process where the second harmonic of the FEL pulse resonantly excites the system via a 1s2p1s \rightarrow 2p transition followed by ionization by the fundamental FEL pulse, which is a type of x-ray resonance-enhanced multiphoton ionization (REMPI). This resonant phenomenon occurs not only for Ar16+^{16+}, but through multiple lower charge states, where multiple ionization competes with decay lifetimes, making x-ray REMPI distinctive from conventional REMPI. With the aid of state-of-the-art theoretical calculations, we explain the effects of x-ray REMPI on the relevant ion yields and spectral profile.

Keywords

Cite

@article{arxiv.2110.08145,
  title  = {Resonance-enhanced multiphoton ionization in the x-ray regime},
  author = {Aaron C. LaForge and Sang-Kil Son and Debadarshini Mishra and Markus Ilchen and Stephen Duncanson and Eemeli Eronen and Edwin Kukk and Stanislaw Wirok-Stoletow and Daria Kolbasova and Peter Walter and Rebecca Boll and Alberto De Fanis and Michael Meyer and Yevheniy Ovcharenko and Daniel E. Rivas and Philipp Schmidt and Sergey Usenko and Robin Santra and Nora Berrah},
  journal= {arXiv preprint arXiv:2110.08145},
  year   = {2021}
}

Comments

8 pages, 5 figures, one supplementary material (not included)