Resistance growth of branching random networks
Probability
2018-05-21 v2
Abstract
Consider a rooted infinite Galton-Watson tree with mean offspring number , and a collection of i.i.d. positive random variables indexed by all the edges in the tree. We assign the resistance to each edge at distance from the root. In this random electric network, we study the asymptotic behavior of the effective resistance and conductance between the root and the vertices at depth . Our results generalize an existing work of Addario-Berry, Broutin and Lugosi on the binary tree to random branching networks.
Keywords
Cite
@article{arxiv.1801.05043,
title = {Resistance growth of branching random networks},
author = {Dayue Chen and Yueyun Hu and Shen Lin},
journal= {arXiv preprint arXiv:1801.05043},
year = {2018}
}
Comments
v2: minor revision, 19 pages