Conductance Distributions in Random Resistor Networks: Self Averaging and Disorder Lengths
Abstract
The self averaging properties of conductance are explored in random resistor networks with a broad distribution of bond strengths . Distributions of equivalent conductances are estimated numerically on hierarchical lattices as a function of size and distribution tail parameter . For networks above the percolation threshold, convergence to a Gaussian basin is always the case, except in the limit --> 0. A {\it disorder length} is identified beyond which the system is effectively homogeneous. This length diverges as ( is the regular percolation correlation length exponent) as -->0. This suggest that exactly the same critical behavior can be induced by geometrical disorder and bu strong bond disorder with the bond occupation probability <-->. Only lattices at the percolation threshold have renormalized probability distribution in a {\it Levy-like} basin. At the threshold the disorder length diverges at a vritical tail strength as , with , a new exponent. Critical path analysis is used in a generalized form to give form to give the macroscopic conductance for lattice above .
Keywords
Cite
@article{arxiv.cond-mat/9405010,
title = {Conductance Distributions in Random Resistor Networks: Self Averaging and Disorder Lengths},
author = {R. F. Angulo and E. Medina},
journal= {arXiv preprint arXiv:cond-mat/9405010},
year = {2009}
}
Comments
16 pages plain TeX file, 6 figures available upon request.IBC-1603-012