Residual strain in free-standing CdTe nanowires overgrown with HgTe

M. Kessel; L. Lunczer; N. V. Tarakina; C. Brüne; H. Buhmann; L. W. Molenkamp

doi:10.1063/1.5085174

Residual strain in free-standing CdTe nanowires overgrown with HgTe

Materials Science 2019-05-22 v1

Authors: M. Kessel , L. Lunczer , N. V. Tarakina , C. Brüne , H. Buhmann , L. W. Molenkamp

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Abstract

We investigate the crystal properties of CdTe nanowires overgrown with HgTe. Scanning electron microscopy (SEM) and scanning transmission electron microscopy (STEM) confirm, that the growth results in a high ensemble uniformity and that the individual heterostructures are single-crystalline, respectively. We use high-resolution X-ray diffraction (HRXRD) to investigate strain, caused by the small lattice mismatch between the two materials. We find that both CdTe and HgTe show changes in lattice constant compared to the respective bulk lattice constants. The measurements reveal a complex strain pattern with signatures of both uniaxial and shear strains present in the overgrown nanowires.

Keywords

cdte nanowires hgte overgrowth residual strain lattice mismatch high-resolution x-ray diffraction heterostructures

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@article{arxiv.1812.01248,
  title  = {Residual strain in free-standing CdTe nanowires overgrown with HgTe},
  author = {M. Kessel and L. Lunczer and N. V. Tarakina and C. Brüne and H. Buhmann and L. W. Molenkamp},
  journal= {arXiv preprint arXiv:1812.01248},
  year   = {2019}
}

Residual strain in free-standing CdTe nanowires overgrown with HgTe

Abstract

Keywords

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