Region-of-interest micro-focus CT based on an all-optical inverse Compton scattering source
Abstract
Micro-focus computed tomography (CT), enabling the reconstruction of hyperfine structure within objects, is a powerful nondestructive testing tool in many fields. Current X-ray sources for micro-focus CT are typically limited by their relatively low photon energy and low flux. An all-optical inverse Compton scattering source (AOCS) based on laser wakefield accelerator (LWFA) can generate intense quasi-monoenergetic X/gamma-ray pulses in the keV-MeV range with micron-level source size, and its potential application for micro-focus CT has become very attractive in recent years due to the fast pace progress made in LWFA. Here we report the first experimental demonstration of high-fidelity micro-focus CT using AOCS (~70 keV) by imaging and reconstructing a test object with complex inner structures. A region-of-interest (ROI) CT method is adopted to utilize the relatively small field-of-view (FOV) of AOCS to obtain high-resolution reconstruction. This demonstration of the ROI micro-focus CT based on AOCS is a key step for its application in the field of hyperfine nondestructive testing.
Keywords
Cite
@article{arxiv.2003.12837,
title = {Region-of-interest micro-focus CT based on an all-optical inverse Compton scattering source},
author = {Yue Ma and Jianfei Hua and Dexiang Liu and Yunxiao He and Tianliang Zhang and Jiucheng Chen and Fan Yang and Xiaonan Ning and Zhongshan Yang and Jie Zhang and Chih-Hao Pai and Yuqiu Gu and Wei Lu},
journal= {arXiv preprint arXiv:2003.12837},
year = {2020}
}