Radiation tolerance tests on key components of the ePIC-dRICH readout card
Abstract
The dual-radiator RICH (dRICH) detector of the ePIC experiment will employ over 300000 SiPM pixels as photosensors, organized into more than 1000 Photon Detection Units. Each PDU is a compact module, approximately 5x5x12 cm^3 in size, including four custom ASICs connected to 256 SiPMs and an FPGA-based readout card (RDO) responsible for data acquisition and control. Considering the moderately harsh radiation environment expected in the dRICH detector, this study reports on proton irradiation tests performed on key components of the RDO card to assess their tolerance to cumulative Total Ionizing Dose (TID) and Single Event Effects (SEE). All tested components demonstrated radiation tolerance beyond the TID levels expected for the dRICH environment, with the exception of the ATtiny817 microcontroller, which showed destructive failure. Furthermore, as expected, the observed Single Event Upset (SEU) rates call for appropriate mitigation strategies in the final system design.
Keywords
Cite
@article{arxiv.2601.09675,
title = {Radiation tolerance tests on key components of the ePIC-dRICH readout card},
author = {S. Geminiani and B. R. Achari and N. Agrawal and M. Alexeev and C. Alice and R. Ammendola and P. Antonioli and C. Baldanza and L. Barion and A. Biagioni and A. Calivà and M. Capua and F. Capuani and A. Ciardiello and E. Cisbani and M. Chiosso and M. Contalbrigo and F. Cossio and M. Da Rocha Rolo and A. De Caro and D. De Gruttola and G. Dellacasa and D. Falchieri and S. Fazio and O. Frezza and N. Funicello and M. Garbini and N. Jacazio and F. Lo Cicero and A. Lonardo and R. Malaguti and F. Mammoliti and M. Martinelli and M. Mignone and C. Mingioni and M. Nenni and F. Noto and L. Occhiuto and A. Paladino and D. Panzieri and P. Perticaroli and S. Plavully and L. Polizzi and L. Pontisso and R. Preghenella and R. Ricci and L. Rignanese and C. Ripoli and C. Rossi and E. Rovati and N. Rubini and M. Ruspa and A. Saputi and F. Simula and F. Spizzo and U. Tamponi and E. Tassi and G. Torromeo and C. Tuvè and G. M. Urciuoli and S. Vallarino and P. Vicini and R. Wheadon},
journal= {arXiv preprint arXiv:2601.09675},
year = {2026}
}
Comments
8 pages, 3 figures, proceedings of the TWEPP 2025 conference submitted to JINST