English

Origin of shallow n-type doping in AlN and Al-rich AlGaN

Materials Science 2025-12-04 v1

Abstract

Achieving efficient n-type doping in AlN, a representative ultrawide bandgap (UWBG) semiconductor, remains a longstanding challenge that limits its application in high-power electronics and deep-ultraviolet optoelectronics. Conventional dopants in AlN often introduce deep levels or form compensating complexes, leading to low free-carrier concentrations. In this work, we combine first-principles defect calculations with a structural search method tailored to explore metastable configurations to systematically investigate donor-type defects in AlN. Our results reveal that the aluminum interstitial (AliAl_i) can exhibit shallow-donor behavior in specific metastable configurations that were previously overlooked. This discovery expands the understanding of n-type dopability in AlN, and highlights the critical role of metastable defects in modulating electronic properties.

Keywords

Cite

@article{arxiv.2512.03390,
  title  = {Origin of shallow n-type doping in AlN and Al-rich AlGaN},
  author = {Yujie Liu and Sieun Chae and Emmanouil Kioupakis},
  journal= {arXiv preprint arXiv:2512.03390},
  year   = {2025}
}

Comments

18 pages, 4 figures