We investigate the optical properties of polycrystalline diamond membranes containing silicon-vacancy (SiV) color centers in combination with other nano-analytical techniques. We analyze the correlation between the Raman signal, the SiV emission, and the background luminescence in the crystalline grains and in the grain boundaries, identifying conditions for the addressability of single SiV centers. Moreover, we perform a scanning transmission electron microscopy (STEM) analysis, which associates the microscopic structure of the membranes and the evolution of the diamond crystal along the growth direction with the photoluminescence properties, as well as a time-of-flight secondary ion mass spectrometry (ToF-SIMS) to address the distribution of silicon in implanted and un-implanted membranes. The results of the STEM and ToF-SIMS studies are consistent with the outcome of the optical measurements and provide useful insight into the preparation of polycrystalline samples for quantum nano-optics.
@article{arxiv.2011.05426,
title = {Optical properties of silicon-implanted polycrystalline diamond membranes},
author = {H. Kambalathmana and A. M. Flatae and L. Hunold and F. Sledz and J. Müller and M. Hepp and P. Schmuki and M. S. Killian and S. Lagomarsino and N. Gelli and S. Sciortino and L. Giuntini and E. Wörner and C. Wild and B. Butz and M. Agio},
journal= {arXiv preprint arXiv:2011.05426},
year = {2021}
}