English

Optical element for X-ray microscopy

Optics 2008-10-01 v1

Abstract

We present a proposal for a X-ray optical element suitable for X-ray microscopy and other X-ray-based display systems. Its principle is based on the Fresnel lenses condition and the Bragg condition for X-ray scattering on a slice of monocrystal. These conditions are fulfilled simultaneously due to a properly machined shape of the monocrystal with a stress at its ends.

Cite

@article{arxiv.0809.5160,
  title  = {Optical element for X-ray microscopy},
  author = {G. Chadzitaskos},
  journal= {arXiv preprint arXiv:0809.5160},
  year   = {2008}
}

Comments

8 pages, 4 figures

R2 v1 2026-06-21T11:25:36.152Z