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On Delay Faults Affecting I/O Blocks of an SRAM-Based FPGA Due to Ionizing Radiations

Space Physics 2014-09-03 v1 Hardware Architecture Popular Physics
Authors: Fatima Zahra Tazi , Claude Thibeault , Yvon Savaria , Simon Pichette , Yves Audet
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Abstract

Experimental means to characterize delay faults induced by bit flips and SEUs in I/O blocks of SRAM-based FPGAs are proposed. A delay fault up to 6.2ns sensitized by an events chain is reported.

Keywords

delay faults SRAM-based FPGA I/O blocks ionizing radiations bit flips single event upsets SEU

Cite

@article{arxiv.1409.0736,
  title  = {On Delay Faults Affecting I/O Blocks of an SRAM-Based FPGA Due to Ionizing Radiations},
  author = {Fatima Zahra Tazi and Claude Thibeault and Yvon Savaria and Simon Pichette and Yves Audet},
  journal= {arXiv preprint arXiv:1409.0736},
  year   = {2014}
}

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