Numerical analysis of the quantum dots on off-normal incidence ion sputtered surfaces
Materials Science
2008-02-09 v1 Statistical Mechanics
Abstract
We implement substrate rotation in a 2+1 dimensional solid-on-solid model of ion beam sputtering of solid surfaces. With this extension of the model, we study the effect of concurrent rotation, as the surface is sputtered, on possible topographic regions of surface patterns. In particular we perform a detailed numerical analysis of the time evolution of dots obtained from our Monte Carlo simulations at off-normal-incidence sputter erosion. We found the same power-law scaling exponents of the dot characteristics for two different sets of ion-material combinations, without and with substrate rotation.
Keywords
Cite
@article{arxiv.cond-mat/0611356,
title = {Numerical analysis of the quantum dots on off-normal incidence ion sputtered surfaces},
author = {Emmanuel O. Yewande and Reiner Kree and Alexander K. Hartmann},
journal= {arXiv preprint arXiv:cond-mat/0611356},
year = {2008}
}
Comments
9 pages, 14 figures