English

NOVA: Coordinated Test Selection and Bayes-Optimized Constrained Randomization for Accelerated Coverage Closure

Methodology 2025-12-02 v1 Hardware Architecture

Abstract

Functional verification relies on large simulation-based regressions. Traditional test selection relies on static test features and overlooks actual coverage behavior, wasting substantial simulation time, while constrained random stimuli generation depends on manually crafted distributions that are difficult to design and often ineffective. We present NOVA, a framework that coordinates coverage-aware test selection with Bayes-optimized constrained randomization. NOVA extracts fine-grained coverage features to filter redundant tests and modifies the constraint solver to expose parameterized decision strategies whose settings are tuned via Bayesian optimization to maximize coverage growth. Across multiple RTL designs, NOVA achieves up to a 2.82×\times coverage convergence speedup without requiring human-crafted heuristics.

Keywords

Cite

@article{arxiv.2512.00688,
  title  = {NOVA: Coordinated Test Selection and Bayes-Optimized Constrained Randomization for Accelerated Coverage Closure},
  author = {Weijie Peng and Nanbing Li and Jin Luo and Shuai Wang and Yihui Li and Jun Fang and Yun and Liang},
  journal= {arXiv preprint arXiv:2512.00688},
  year   = {2025}
}
R2 v1 2026-07-01T08:01:18.303Z