The Hall response function of symmetric and asymmetric planar Hall effect devices is investigated by scanning a magnetized tip above a sensor surface while simultaneously recording the topography and the Hall voltage. Hall sensor geometries are tailored using a Focused Ion Beam, in standard symmetric and new asymmetric geometries. With this technique we are able to reduce a single voltage probe to a narrow constriction 20 times smaller than the other device dimensions. We show that the response function is peaked above the constriction, in agreement with numerical simulations. The results suggest a new way to pattern Hall sensors for enhanced spatial resolution.
@article{arxiv.cond-mat/0210517,
title = {New geometries for high spatial resolution hall probes},
author = {H. Guillou and A. D. Kent and G. W. Stupian and M. S. Leung},
journal= {arXiv preprint arXiv:cond-mat/0210517},
year = {2009}
}
Comments
12 pages, 5 figures, submitted to Journal of Applied Physics